Instrumentation for electronic mobility and carrier concentration measurements in semiconductor samples, using the van der Pauw method . Research, Society and Development, [S. l.], v. 10, n. 6, p. e41310615229, 2021. DOI: 10.33448/rsd-v10i6.15229. Disponível em: https://rsdjournal.org/rsd/article/view/15229. Acesso em: 5 dec. 2025.