Determination of thickness and refractive index of SiO2 thin films using the cross-entropy global optimization method. Research, Society and Development, [S. l.], v. 10, n. 10, p. e326101019028, 2021. DOI: 10.33448/rsd-v10i10.19028. Disponível em: https://rsdjournal.org/rsd/article/view/19028. Acesso em: 5 dec. 2025.